My research centers on exploring the reliability of transistor devices. I utilize pulsed-DC measurement techniques to investigate their operational limits and the stresses they can endure without compromising performance or shortening their expected lifespan. By reducing self-heating effects, these measurements are essential for understanding how thermal factors influence device performance. This approach enables the development of more precise models, aiding circuit designers in maximizing the potential of current technologies.
I joined and will soon graduate from Dr. John Cressler group where I study the tradeoff between high performance and reliability of electronics (we want both!). http://cressler.ece.gatech.edu/.
Google Scholar Link: https://scholar.google.com/citations?hl=enuser=EU83wKIAAAAJ
Note: You can know more about my past contributions in electronics and materials science field in the publications page.