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Design of Experiments
Robust Parameter Design
- V. Roshan Joseph and Wu, C. F. J. (2002) “Robust Parameter Design of Multiple Target Systems”. Technometrics 44, 338-346.
- V. Roshan Joseph and Wu, C. F. J. (2002) “Operating Window Experiments: A Novel Approach to Quality Improvement”. Journal of Quality Technology 34, 345-354.
- V. Roshan Joseph (2003) “Robust Parameter Design with Feed-Forward Control”. Technometrics 45, 284-292.
- V. Roshan Joseph (2004) “Quality Loss Functions for Nonnegative Variables and Their Applications”. Journal of Quality Technology 36, 129-138.
- V. Roshan Joseph and Wu, C. F. J. (2004) “Failure Amplification Method: An Information Maximization Approach to Categorical Response Optimization” (with discussions and rejoinder). Technometrics 46, 1-31. (Jack Youden Prize).
- V. Roshan Joseph (2007) “Taguchi’s Approach to Robust Parameter Design: A New Perspective”. IIE Transactions-Quality and Reliability Engineering 39, 805-810.
- Jeng, S. L., V. Roshan Joseph, and Wu, C. F. J. (2008) “Modeling and Optimization for Failure Amplification Method“. Journal of Quality Technology 40, 128-139.
- V. Roshan Joseph. (2008) “Tolerance Design”.
- Kang, L. and V. Roshan Joseph. (2009) “Bayesian Optimal Single Arrays for Robust Parameter Design”. Technometrics, 51, 250-261.
- Yu, I.-T. and V. Roshan Joseph. (2011) “Bayesian Process Optimization Using Failure Amplification Method”. Applied Stochastic Models in Business and Industry, 27, 402-409.
- V. Roshan Joseph, Gu, L., Ba, S., and Myers, W. R. (2019), “Space-Filling Designs for Robustness Experiments”. Technometrics, 61, 24-37. arXiv.
Process Control
- Pal, B.K. and V. Roshan Joseph (1998) “Developing Objective Strategies for Monitoring Multi-Input/Single-Output Chemical Process”. Quality Improvement Through Statistical Methods (Ed. Abraham, B.), Birkhauser, Boston, 151-162.
- V. Roshan Joseph (2001) “Optimum Setting for a Parameter Operating Under Trend”. Recent Developments in Operational Research (Eds. Agarwal, M. L. and Sen, K.), Narosa Publishing House, New Delhi, 163-168.
Reliability
